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characterization techniques such as scanning electron microscopy (SEM, HRTEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and chemisorption techniques (TPD, TPR) is needed. Your contribution
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procedures. Equipment Utilized Schlenk glassware, glovebox usage and maintenance, particle size, thermal analysis, x-ray diffraction, and infrared spectroscopy instrumentation. Physical Demands and Work
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, in accordance with regulations, requires your arrival to be authorised by the competent authority at the MESR. Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UMR6251-DIDLOI-001
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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Experience with structure characterisation using microscopy and diffraction methods Desirable Application/interview Ability to work independently Essential Application/interview Evidence of presentation skill
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DTU Tenure Track Researcher on Nanoreactors for Operando Visualizations of Nanoparticle Catalysis...
experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command of these TEM techniques under the lowest possible
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the 2025 Nobel Prize in Chemistry. Electron microscopy and electron diffraction offer powerful tools for advanced structural characterization. Aberration correction now enables imaging with true atomic
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and Technology (NTNU) for general criteria for the position. Preferred selection criteria Documented competence within X-ray imaging, diffraction or electron microscopy, preferably transmission
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addition, you must have comprehensive experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command
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participate at all the experimental steps required for obtaining giant optical nonlinearities. This procedure includes thin film deposition, annealing, X-Ray Diffraction studies (XRD), Scanning Electron