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& acylation),Polymerization, TLC, distillation, LLE, Titrations, UV-Vis, GCMS, LCMS, HPLC,MALDI-TOF, X-ray diffraction, FTIR, Chimera software for molecular docking. Essential Duties and Responsibilities
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of the obtained materials using elemental analysis, nuclear magnetic resonance (RMN), ICP-OES, infrared spectroscopy (IR), ultrared-visible spectroscopy (UV-Vis) and Raman spectroscopy, X-ray diffraction, X-ray
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part of the Forschungsverbund Berlin (https://www.fv-berlin.de/) and part of the Leibniz Association (https://www.leibniz-gemeinschaft.de ). You can find more details on the institute webpage: https
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techniques (e.g. NMR, IR, UV-vis spectroscopy, Mass spectrometry, and X-ray diffraction) necessary for characterizing new molecules and polymers. Experience with photochemistry (e.g. quantum yield analysis
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-crystal X-ray diffraction), and mass spectrometry. Thermal behaviour will be assessed using differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA), complemented by mass spectrometric
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techniques (e.g. NMR, IR, UV-vis spectroscopy, Mass spectrometry, and X-ray diffraction) necessary for characterizing new molecules and polymers. Experience with photochemistry (e.g. quantum yield analysis
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational
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funding. Appointment Start Date: Fall 2025 Group or Departmental Website: https://hph.stanford.edu/careers (link is external) How to Submit Application Materials: Submit all application materials
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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used