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Sorbonne Université SIS (Sciences, Ingénierie, Santé) | Paris 15, le de France | France | 23 days ago
étudiera la croissance et la structure de l'étain par microscopie à effet tunnel et diffraction des rayons X de surface sur synchrotron. Des résultats préliminaires ont déjà été obtenus sur les surfaces Ag
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sollicitées pour réaliser les expériences de haute pression, tandis que la spectroscopie Raman et la diffraction des rayons X permettront d'obtenir directement des informations structurales sur les matériaux
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acquisition techniques are combined to extract nanoscale dimensional information well below conventional diffraction limits. These measurements are optimized by tailoring the illumination so as to yield
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, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction, electron microscopy, and porosity analysis. The candidate is expected to have a thorough understanding
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include Atomic, Molecular and Optical (AMO) science, time-resolved X-ray diffraction and spectroscopy and ultrafast optical spectroscopy. Junior-scientist / PhD-student – Laser physics and applications (308
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Your Job: Many technologically important material properties are closely related to disorder and short-range structural correlations. Diffuse scattering observed in a diffraction experiment on
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Posting Summary Logo Posting Number RTF00045PO26 USC Market Title Post Doctoral Fellow Link to USC Market Title https://uscjobs.sc.edu/titles/156387 Business Title (Internal Title) Postdoctoral
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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line, glovebox) Proficiency in standard characterization techniques (NMR, IR, MS; GC, GC-MS X-ray diffraction) Familiarity with catalytic reactions; experience with high-pressure equipment (autoclaves
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(phosphate, oxides) synthesis by solid state reactions, hydrothermal process or electrodeposition. These solids will be characterized through i) diffraction of X-rays (XRD), ii) Scanning Electron Microscopy