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Technology (FTMC, Vilnius) The Center for Physical Science and Technology (FTMC, https://ftmc.lt/en/ ) is the largest non-university scientific organization in the Baltic states with more than 700 staff
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The Advanced Photon Source (APS) (https://www.aps.anl.gov/ ) at Argonne National Laboratory (Lemont, Illinois, US (near Chicago)) invites applicants for a postdoctoral position to develop and
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characterization techniques such as scanning electron microscopy (SEM, HRTEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and chemisorption techniques (TPD, TPR) is needed. Your contribution
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procedures. Equipment Utilized Schlenk glassware, glovebox usage and maintenance, particle size, thermal analysis, x-ray diffraction, and infrared spectroscopy instrumentation. Physical Demands and Work
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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Experience with structure characterisation using microscopy and diffraction methods Desirable Application/interview Ability to work independently Essential Application/interview Evidence of presentation skill
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DTU Tenure Track Researcher on Nanoreactors for Operando Visualizations of Nanoparticle Catalysis...
experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command of these TEM techniques under the lowest possible
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addition, you must have comprehensive experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command
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in any of the following methods will be advantageous: Single-crystal crystallography, Powder X-ray diffraction, NMR, UV-vis, IR and Luminescence spectroscopy, electrochemistry. The candidate will hold
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participate at all the experimental steps required for obtaining giant optical nonlinearities. This procedure includes thin film deposition, annealing, X-Ray Diffraction studies (XRD), Scanning Electron