Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
Chromatograph, Elemental Analyzer, Spectrophotometer, X-ray Diffraction Unit and any other shared teaching/research equipment. Train and oversee student use as needed. Repair and replace parts as needed. Maintain
-
at: https://dre.pt/application/conteudo/127238533  ; and in accordance with the consolidated version with the changes resulting from the update, approved on December 10, 2025 by the Board of Directors
-
, currently focusing on scattering and diffraction methods, including related imaging techniques, laboratories and sample environment. About your role: Disciplinary group leader of beamline teams, laboratories
-
techniques such as Energy Dispersive X-Ray Spectroscopy (EDX), Backscattered Electron (BSE) imaging, and Selected Area Electron Diffraction (SAED). Extensive experience in processing samples for electron
-
such as the heart and nervous system, invariably with fatal consequences. The project will focus on probing the molecular factors underlying this instability (see for example https://www.nature.com/articles
-
new ways. For detailed information, please visit us at http://cts.shanghaitech.edu.cn/. CTS is planning to establish 20-25 independent research laboratories in the near future. Each laboratory has
-
a range of characterization techniques, including X-ray diffraction, electron microscopy, X-ray photoelectron spectroscopy, as well as various electrochemical measurements, with opportunities
-
analytical techniques including electron back scatter diffraction (EBSD) to link the electrochemical performance of the electrode with the surface structure and chemistry. Materials of interest will include
-
diffraction study. This research will utilize advanced measurement facilities such as the X-ray free-electron laser facility SACLA, the large-scale synchrotron radiation facility SPring-8, NanoTerrace, and
-
fabrication. Receive individual trainings to learn state-of-the-art methodologies, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), electrochemcial