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BET/DFT surface area analysis, DSC, x-ray diffraction, Raman and IR spectroscopy etc. It is also planned to use synchrotron radiation facilities. Qualifications To be admitted for studies at third-cycle
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Completed university studies (Master) in Chemistry or related field Experience in metal-organic syntheses Experience in working with glove boxes and Schlenk methods Experience in X-ray diffraction techniques
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and flow chemistry Use of spectroscopic and spectrometric techniques as well as single crystal X-ray diffraction analysis to study molecular properties and molecular structures in solution and in
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glove boxes and Schlenk methods Experience in X-ray diffraction techniques and other structural characterizations Experience in working with radionuclides, esp. actinides and TRU elements is of advantage
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. The candidate will be engaged in synthesis of new materials and characterization of these materials using BET/DFT surface area analysis, DSC, x-ray diffraction, Raman and IR spectroscopy etc. It is also planned
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. The candidate will be engaged in synthesis of new materials and characterization of these materials using BET/DFT surface area analysis, DSC, x-ray diffraction, Raman and IR spectroscopy etc. It is also planned
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elucidation of atomic and electronic structures, and physical properties. The group is in possession of state-of-the-art diffraction instrumentation and single-crystal electron and X-ray crystallography, and
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methodologies of scanning probe microscopy and real-time x-ray diffraction studies for investigating the microstructure and nanomorphology of solution-processed non-fullerene acceptor active layers and monitor
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. The researcher will also have responsibility for research infrastructure related to powder X-ray diffraction (PXRD) and Raman spectroscopy. The focus will be on niobates, tantalates, group V dichalcogenides, and
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scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) as well as sample preparation using a focused ion beam (FIB) for transmission electron microscopy (TEM). Established record