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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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-diffraction studies of complex materials and nanodevices. The candidate will perform X-ray scattering experiments with nanofocused beams to study the structure of self-assembled superlattices of nanoparticles
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-diffraction studies of complex materials and nanodevices. The candidate will perform X-ray scattering experiments with nanofocused beams to study the structure of self-assembled superlattices of nanoparticles
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laboratory PDF diffractometer, including the optimization of measurement protocols and combined mass spectrometry Experiments at synchrotron radiation facilities Analysis of powder X-ray diffraction (PXRD) and
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at the receiver, steep terrain between the turbines and the receiver with occasional diffraction during propagation. A source model to explore is a distribution of static monopoles (non-aeroacoustic sources) and
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of nanofabricated sample supports and tracking algorithms for 5D electron diffraction (5DED). EMAT is one of the leading electron microscopy centers in the world and has a vast expertise in both fundamental and
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for understanding natural magmatic processes on earth & other planetary bodies. Neutron diffraction is a powerful technique for studying the atomic scale structure of these materials, but the current technology to
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optimal operating conditions and followed by surface analysis techniques (e.g. Scanning electron microscope, X-ray diffraction for residual stress measurements, Electron Back-Scattered Diffraction and