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scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) as well as sample preparation using a focused ion beam (FIB) for transmission electron microscopy (TEM). Established record
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Dispersive X-ray Spectroscopy (EDS), dynamic light scattering (DLS), potential zeta, X-ray diffraction (XRD), infrared spectroscopy (FTIR), Raman spectroscopy, X-ray Photoelectron Spectroscopy (XPS), elemental
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diffraction tomography (ODT). The ODT will be used for imaging organoids and a correlative fluorescence microscopy must be integrated with the ODT. A close cooperation with COMBAT partners associated with WP 2
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ThermoFisher Helios 660 Nanolab dual-beam system, and various other capabilities. The NCMN manages a wide range of facilities, including x-ray diffraction and electron microscopy. Mechanical testing systems