12 density-functional-theory-dft Postdoctoral positions at University of Twente in Netherlands
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, spinal cord injury etc) through real-time neural control of wearable robotic exoskeletons. You will be developing next-generation (low and high-level) control algorithms for wearable exoskeletons that use
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developing morphing surfaces enabled by Shape Memory Alloys (SMAs). These adaptive winglets are designed to optimize aerodynamic performance by responding to temperature variations and incorporating active
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partners to reduce CO2 emissions in steel production using machine learning. You can find more information here . You will work on a theoretical and an applied project on data-enhanced physical reduced order
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associated ambition. For more information on this position, please contact dr.ir. Richard Loendersloot, r.loendersloot@utwente.nl. Screening is part of the selection procedure. The first job interviews are
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assess its performance, techno-economic feasibility, and environmental and social impact. The project aligns closely with the European Green Deal and supports strategic autonomy by fostering collaboration
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the impact of transcutaneous spinal cord stimulation on motor unit activity 3. Discerns functional motor units from impaired motor units. 4. Estimates the ankle torque contributed from functional
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, you will play a central role in developing and validating a novel control strategy for bionic limbs based on real-time ultrasound imaging. Your key responsibilities will include: Designing and
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-master design program being part of the program Business Information Technology. For more information on the BIT EngD program, see https://www.utwente.nl/en/education/tgs/interested-in/engd/programmes
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, integrated with current technology, and coupled to technological use cases. In this two-year project, a postdoctoral researcher will join forces with academic and industrial consortium partners to map how
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role – from microscopes to telescopes, but also for advanced lithography. For the next-generation “hyper-NA” lithographic tool of ASML, the demands of keeping the wafer surface at the focal point