Sort by
Refine Your Search
-
14, 1–9 (2024). (2) Reischig, P. & Ludwig, W. Three-dimensional reconstruction of intragranular strain and orientation in poly-crystals by near-field X-ray diffraction. Curr. Opin. Solid State Mater
-
images, detecting hidden information in generated images The postdoctoral researcher will conduct research activities in steganography, steganalysis, and detection of generated contents. Artificially
-
two ultrasound imaging techniques: ultrasound localization imaging to assess the presence of neovascularization and ultrasound spectroscopy to try to determine the presence and quantity of intraplaque
-
https://science.curie.fr/recherche/developpement-cancer-genetique-epigenetique/ STATUS: EXPIRED X (formerly Twitter) Facebook LinkedIn Whatsapp More share options E-mail Pocket Viadeo Gmail Weibo Blogger
-
thesis work (defended at LMA in December 2024) on “Low-frequency passive imaging”. This work follows several studies on the subject (theses, internships and contracts) over a period of more than 10 years
-
innovative methods for processing and analyzing 7Tesla MRI images of different modalities and formats (NIFTI, DICOM, etc.) using machine learning and artificial intelligence techniques. These methods will be
-
laser deposition (PLD); • Implementing partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction
-
of the studied assemblies by X-ray diffraction (XRD) and Raman spectroscopy. The experimental parameters obtained will serve as input data and will make it possible to calibrate the elementary electrochemical
-
throughput applications. The focus will lie on so-called multislice algorithms to obtain atomic resolution and three-dimensional phase images, that can be correlated with conventional tomography (by rotating
-
-DSC, MS) will be used to understand the mechanisms and selectivity by identifying reaction intermediates. The synthesized materials will be characterized by X-ray diffraction (XRD), FTIR, Raman