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of devices Experience with atomic force microscopy (AFM) and scanning electron microscopy (SEM) for device characterization. Solid understanding of condensed matter physics and materials science General Skills
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iNANO at Aarhus University is seeking a postdoctoral fellow for the Novo Nordisk Foundation CO2 R...
. Contact info Applicants seeking further information are invited to contact Alfred Spormann, e-mail: aspormann@au.dk Deadline for application and the recruitment process The application deadline is 30th
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are required for the new generation of anti-fouling coatings. Anti-corrosive coatings Corrosion can lead to structure failures that have dramatic consequences for humans and surrounding environments. The use
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. Contact info Applicants seeking further information are invited to contact Alfred Spormann, e-mail: aspormann@au.dk Deadline for application and the recruitment process The application deadline is 30th
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60 senior scientists, ~100 Postdocs and ~100 PhD students. The center combines expertise and faculty from Physics, Chemistry, Molecular biology and Medicine to carry out world class interdisciplinary
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to comment on the part of the assessment that concerns him/her self. Once the recruitment process is completed a final letter of rejection is sent to the deselected applicants. Letter of reference If you want
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given the opportunity to comment on the part of the assessment that concerns him/her self. Once the recruitment process is completed a final letter of rejection is sent to the deselected applicants
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, Belgium and Brazil. Your profile You have a PhD degree in chemistry, materials science, nanoscience, physics or biology, or a related subject and are interested in interdisciplinary research. The ideal
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, Belgium and Brazil. Your profile You have a PhD degree in chemistry, materials science, nanoscience, physics or biology, or a related subject and are interested in interdisciplinary research. The ideal
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. Evaluate and understand how experimental conditions effect both the chemical, physical, and mechanical properties of the prepared films (e.g., using scanning electron and atomic force microscopy, infrared