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can be found at https://postdoc.wustl.edu/prospective-postdocs-2/ . For more information on the Sibley Lab, please visit https://sites.wustl.edu/sibleylab . Trains under the supervision of a faculty
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emissions of the European Union. The major part of these emissions comes from the reduction of iron ore in the blast furnace process. One line of reducing these emissions is to increase the scrap metal
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project of studying nanoplastic generation and release via nanoscale abrasive wear using advanced atomic force microscopy (AFM) tools. This work will be supported through the NSF CAREER award. The project
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. Please note that this post may be eligible to be sponsored under the Skilled Worker visa route if tradeable points can be used under the Skilled Worker visa rules. For more information please visit: https
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/experimental work, with a focus on mouse colony maintenance, processing and analysis of human and animal tissues using immunohistochemistry and confocal microscopy, and the potential to assist in rodent surgery
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transmission electron microscopy (TEM), atomic force microscopy (AFM), and X-ray diffraction (XRD), etc. Prepare manuscripts, reports, and presentations for internal discussions and external publication
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/infrastructure/biochemical-imaging-centre-umea-bicu/ ). The infrastructure provides state-of-the-art imaging technology including advanced light microscopy, atomic force microscopy and correlative light and
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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | 9 days ago
October 2026 Description The emergence of hafnia-based ferroelectric (FE) memories [Böscke2011] has opened a new paradigm for ultra-low-power edge computing. Hafnia is fully compatible with CMOS technology
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behaviour remain largely enigmatic. Your work will focus on developing computational tools to bridge the gap between high-resolution magnetic observations and micromagnetic simulations. You will lead the
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disciplines is mandatory: aberration-corrected scanning transmission electron microscopy; micro- and nanofluidics; atomic force/scanning probe microscopy; free-space laser optics and preferably optical tweezing