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accurate measurements during emergencies, such as those encountered in pre- or post-detonation scenarios. The nuclear forensics program at NIST focuses largely on analytical method development, new and
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correlations and prediction methods. The program will build on our existing efforts using Quantitative Structure-Property Relationship (QSPR) methodologies and modern machine learning methods (support vector
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switched with single-flux-quantum (SFQ) pulses. Candidates interested in the logic aspects of this program should contact Sam Benz. Candidates interested in the magnetic memory aspects of this project should
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transitions. Many x-ray lines and satellites remain to be experimentally verified, in comparison with theory. We have a program to carry out these investigations using TES microcalorimeter detectors with 5 eV
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the “NIST-on-a-chip” program, we are designing and building chip-scale accelerometers as field-deployable SI-traceable standards. The accelerometers employ a micromechanical structure in conjunction with a
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301.975.8582 Michael Garth Huber michael.huber@nist.gov 301 975 5641 Description This program explores complementary aspects of atom and neutron interferometry with particular emphasis on their interplay with
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framework for enabling system interoperability. Background in algebraic topology or similar field in mathematics, or in the theory of programming languages would be useful. key words Formalization; Dynamics
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tested in the research community which include highly novel methods such as melt pool emission thermography or spectroscopy, structured light projection or other machine vision applications, acoustic
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center. Applicants are expected to be skilled in one of the programming language such as C++/C, Perl, Matlab, or R, and have majored in Chemistry, Statistics, or Computer Science. Reference Yang X, et al
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@nist.gov 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for emerging nanotechnologies. SEM