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Thermodynamics; Property Measurements Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
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; discrete phase. Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
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applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
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near-infrared spectroscopy; polyolefins; circular economy; machine learning Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment
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to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
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. citizens level Open to Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00
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@nist.gov 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for emerging nanotechnologies. SEM
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are developing object-oriented computational tools for the analysis of materials with complex microstructures. Starting from a digitized micrograph, the program identifies features in the image, assigns material
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potentially competing performance goals. Achieving these goals requires the development and application of technologies, such as high performance building envelopes and advanced cooling and ventilating systems
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Postdoctoral applicants Stipend Base Stipend Travel Allotment Supplementation $82,764.00 $3,000.00