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(lithography, deposition, exfoliation and transfer of 2D materials). Characterization of 2D materials using Raman spectroscopy, AFM, and related techniques. Integration of such devices into low-temperature STM
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materials). Characterization of 2D materials using Raman spectroscopy, AFM, and related techniques. Integration of such devices into low-temperature STM experiments. Collaboration with group members and
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National Board on Research Integrity (TENK ) Highest degree certificate and transcripts of studies (with clear explanation on the grading scale) Contact details (affiliation, email, telephone) of two
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list of publications (if any). You may, if you wish, follow the CV guidelines by the Finnish National Board on Research Integrity (TENK ) Highest degree certificate and transcripts of studies (with clear