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, AFM, XRD, eCV, Hall, Nomarski, low- and room-temperature PL). Successful applicants will gain expertise in compound semiconductor epitaxy, advanced characterisation and will combine this with
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, and AFM microscopy. Reporting results, preparing manuscripts for publication, and presenting findings at conferences and seminars. Short-term international research visits (approx. one month per year
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program the memristors Operando characterizing the device electrically and morphologically using conductive atomic force microscopy (C-AFM) Access and active control of advanced experimental setups Your
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Master Thesis in Physics or Materials Science: Remanent phase shifter based on memristive technology
microscopy (AFM), X-ray reflectometry (XRR), and ellipsometry, along with electrical characterization of memristive switching behavior. Individualized training in state-of-the-art laboratory techniques, hands
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of the printed layers using profilometry, SEM and AFM to ensure optical quality and adhesion. Leading the production of smart window modules. Where to apply Website https://seuelectronica.upc.edu/en/procedures
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Quantum Materials and Devices – Deng Research Group Prof. Bingchen Deng (https://luddy.indiana.edu/contact/profile/index.html?bingchen_deng) in the Department of Intelligent Systems Engineering at Indiana
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School graduates over a thousand students who are ready to take on great ambitions and challenges. For more details, please view: https://www.ntu.edu.sg/eee We are seeking to hire a Research Fellow to
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of this joint laboratory is towards the development of innovative nanotechnologies and nanomaterials for various electronic and photonic applications. For more details, please view https://www.ntu.edu.sg/cintra
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. The candidate will work on the newest instrument, which is specifically designed for measurements combining AFM and photoluminescence. Tip-enhanced photoluminescence of single molecule on thick insulator The PhD
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force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and secondary ion mass spectrometry (SIMS). Electrical properties will be evaluated using Hall effect