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handling and cleaning protocols. - Perform surface and thin film characterization of chips used for flip-chip bonding experiments. Characterization techniques include AFM, optical inspection, IR transmission
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engineer will contribute to the development, optimization, and operation of advanced microscopy devices, notably High-speed AFM and AFM-IR (atomic force microscopy coupled with infrared spectroscopy) and
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» Physical chemistryEducation LevelPhD or equivalent Skills/Qualifications Synthesis of monomers Deposition of MIP films on conductive substrates AFM imaging of MIP films and MIP NPs Development
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electron spin resonance. For more information about the group, see: https://www.nist.gov/pml/nanoscale-device-characterization-division/nanoscale-processes-and-measurements-group/scanning . U.S. Citizen
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contact and thus minimize friction and damage to the surfaces for improved energy efficiency [5,6]. To characterize these different polymer brushes, atomic force microscopy (AFM) is used, which in its
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to apply, visit our Job Vacancies web page at http://www.ncl.ac.uk/vacancies/ . To apply, please complete the online application form, upload your CV, and provide a supporting statement demonstrating how you
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, please view https://www.ntu.edu.sg/newri . We are looking for a Research Fellow to support the research project on “Novel High Performance Piezoelectric Thin Film Composite (TFC) Nanofiltration/Reverse
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found here https://www.maxiv.lu.se/beamlines- accelerators/support-labs/microscopy-labs/ . This is a temporary position from March until October 2026. Qualifications for a successful candidate are: Hold
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épaisseur (épaisseur maximale de quelques nanomètres). Une partie importante du travail de thèse mettra œuvre de nombreuses techniques d'analyses de surface (microscopies (AFM, MEB, fluorescence
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Postdoc in experimental studies of phase behavior of ABC-miktoarm star block copolymers in thin f...
the development of GISAXS data analysis methods and is responsible for analyzing the data obtained. The postdoc will also prepare and characterize the thin films studied using e.g. spin coating and AFM. The optimal