Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
microscopy) and has straightforward access to nanomaterial characterizations (TEM, AFM, DLS, zetametry). It will bring the candidate to work in a very dynamic scientific atmosphere, embracing energy and
-
-filler composite fabrication Experience with at least several of the following techniques: SEM, SAXS, DLS, DSC, TGA, DMA, AFM, rheology, adhesion testing, FTIR, Raman, or comparable methods Evidence of
-
therapeutic strategy using genetically engineered MSCs to provide novel treatment options for two rare ocular surface diseases leading progressively to blindness. The project is funded by AFM-Téléthon and
-
, DLS, DSC, TGA, DMA, AFM, rheology, adhesion testing, FTIR, Raman, or comparable methods Evidence of scientific output (e.g., peer-reviewed publications, preprints, patents, software, industrial reports
-
. Our research takes a multifaceted approach, combining imaging of organoids and animal embryos, mechanical measurements using atomic force microscopy (AFM) and other in-house technologies, as
-
/ Partnerships Partners of the PEPR DIADEM – CINEMA project funding this PhD: IRCER, Institut P’, ILM https://www.pepr-diadem.fr/projet/cinema-2/ Scientific Field and Context The optimization of growth–property
-
to learn state-of-the-art lab methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and electrochemistry. Additionally, synchrotron
-
proper-ties are only probed at low frequencies (a few tens of Hz). Recently we have used an atomic force micro-scope (AFM) to probe the thermal capillary oscillation of a hemispherical bubble or drop
-
. For general application assistance or if you have questions about a job posting, please contact Human Resources at 479.575.5351. Department: Min Zou Reports Department's Website: https://engineering.uark.edu
-
, data acquisition hardware. Data Acquisition: Execute complex experiments involving high-bandwidth electrical measurements and advanced microscopy imaging (i.e., AFM and SEM) Signal Processing: Develop