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crosslinking of the illuminated area: the LEPO's expertise in scanning probe microscopy (AFM, STM) combined with light excitations will be used to monitor the evolution of the assemblies formed under
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on systems developed by grazing angle deposition (oxides and metals) for optical, optronic, and thermochromic applications. Where to apply Website https://oficinavirtual.uca.es/oficinaVirtual
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materials and structures characterization, such as profilometry, optical microscopy, SEM and AFM. Perform micro- and nano-fabrication activities, including thin film deposition, spin coating, reactive ion
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and nc-AFM). They will also have the opportunity to work within an excellent interdisciplinary team, being supervised by Prof. David Écija. The position is offered starting on January 1st, 2026. Funded
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(including molecules, polymers and two-dimensional networks), for advanced optoelectronic applications, using scanning probe techniques (STM, STS and nc-AFM). He/she will also have the opportunity to work
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deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM
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knowledge on AFM, SEM or other charaterisation techinques will be an asset Experience in processing of nitride materials, optical and electrical characterization of nitride devices and quantum structures
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physics and characterization techniques, experience in epitaxy of nitrides by MBE and practical knowledge on AFM, SEM or other charaterisation techinques will be an asset Knowledge about physics of
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with molecular beam epitaxy (MBE). Experience with magneto-optic Kerr effect (MOKE), Hall effect measurements, SQUID magnetometry, X-ray diffraction (XRD), AFM, or related characterization techniques
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multifunctional characterization. The candidate should correlate high-resolution morphological and electrostatic data (obtained by AFM, KPFM, and SKPM) with electrical and optical measurements in complete devices