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dark-field STEM imaging, energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy, at the intersection of electron microscopy, software engineering and machine learning. Major
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physical characterization techniques (differential scanning calorimetry, dynamic light scattering, small angle neutron and/or x-ray scattering) to characterize the DIBs; and (3) Develop/implement image
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-resolution microscopy, and in situ neutron or X-ray scattering and tomography methods. Strong background in computational and image-processing software, scientific programming, and high-performance computing
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industrial imaging data. You will directly contribute to developing and deploying algorithms for multi-modal tomography (X-ray, neutron, and electron), advancing methods for non-destructive evaluation (NDE