Sort by
Refine Your Search
-
transport measurements and point contact spectroscopy measurements, THz-Mueller Matrix Ellipsometry and advanced structural characterization (e.g. TEM, polarized neutron diffraction) as well as theoretical
-
and Technology (NTNU) for general criteria for the position. Preferred selection criteria Documented competence within X-ray imaging, diffraction or electron microscopy, preferably transmission
Searches related to diffraction
Enter an email to receive alerts for diffraction positions