Sort by
Refine Your Search
-
reside in the Materials Joining Group in the Materials Analysis and Interface Science Section, Materials Science and Technology Division, Physical Sciences Directorate, at Oak Ridge National Laboratory
-
& Interface Science Section of the Materials Science and Technology Division (MSTD), Physical Sciences Directorate at Oak Ridge National Laboratory (ORNL). As part of our research team, you will collaborate
-
. This position resides in the Neutron & X-Ray Scattering, & Thermophysics group in the Materials Analysis and Interface Science Section, Materials Science and Technology Division, Physical Sciences Directorate
-
, and measure success. Basic Qualifications: A Ph.D. in Polymer Chemistry, Organic Chemistry, Polymer Science and Engineering, Chemical Engineering, Materials Science and Engineering, or a closely related
-
manufacturing datasets, including sensor streams, in-process signals, post-process characterization data, simulation outputs, and digital twin data. Design and implement scalable data engineering pipelines
-
engineers and maintenance teams. Provide technical expertise during corrective maintenance activities and post‑maintenance evaluations to ensure equipment performance and reliability. Support systems
-
significance, large dollar value, and high complexity. Award and manage a variety of contract types, including, but not limited to fixed price, time & material, and cost type. Candidate will perform post-award
-
planning activities to ensure environmental requirements (NEPA, need for environmental permits, etc.) are identified accurately and in a timely manner. Work with Waste Services Representatives and waste
-
engineers and maintenance teams. Provide technical expertise during corrective maintenance activities and post‑maintenance evaluations to ensure equipment performance and reliability. Support systems
-
PhD in materials science and engineering, physics, chemistry, or electrical engineering or a related field. Preferred Qualifications: Experience in scanning transmission electron microscopy Background