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nanoparticle-based systems Operando characterization by surface sensitive X-ray diffraction at synchrotron radiation In-situ characterization by Infrared spectroscopy and mass spectrometry Collaborate closely
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of the obtained materials using elemental analysis, nuclear magnetic resonance (RMN), ICP-OES, infrared spectroscopy (IR), ultrared-visible spectroscopy (UV-Vis) and Raman spectroscopy, X-ray diffraction, X-ray
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Your Job: Many technologically important material properties are closely related to disorder and short-range structural correlations. Diffuse scattering observed in a diffraction experiment on
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PhD student at ILL: studying In situ neutron diffraction for green steel and functional metal oxides
for hydrogen reduction by in situ methods You will join the diffraction group at the ILL, Grenoble, France, and work on the powder diffractometers D1B and D20. They are specialised for time-resolved in situ
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structural characterization of the corneocyte–lipid interface using state-of-the-art neutron diffraction and neutron reflectometry, combined with advanced optical microscopy approaches. The project is
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in magnetoelectric antiferromagnets. You will join the diffraction group at ILL, Grenoble, France. The diffraction group operates several powder and single-crystal diffractometer dedicated
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PhD student at ILL on Advanced Neutron Imaging for Defect Mapping in Repaired Aero-Engine Components
, engineering or a closely related science. • Strong interest in experimental imaging techniques is desirable, knowledge in neutron and/or X-ray imaging and diffraction as well as programming would be
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to staff position within a Research Infrastructure? No Offer Description The Institute of Applied Optics (ITO) at the University of Stuttgart has a strong background in optical metrology, diffractive
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several real-time growth monitoring tools: RHEED (reflection high-energy electron diffraction), ellipsometry, wafer curvature measurements⁶, and an optical flux measurement system⁷. These tools are now
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and Technology (NTNU) for general criteria for the position. Preferred selection criteria Documented competence within X-ray imaging, diffraction or electron microscopy, preferably transmission